Comparison of Power Dependence of Microwave Surface Resistance of Unpatterned and Patterned YBCO Thin Film
نویسندگان
چکیده
The effect of the patterning process on the nonlinearity of the microwave surface resistance RS of YBCO thin films is investigated. With the use of a sapphire dielectric resonator and a stripline resonator, the microwave RS of YBCO thin films was measured before and after the patterning process, as a function of temperature and the rf peak magnetic field in the film. The microwave loss was also modeled, assuming a J2 rf dependence of ZS(Jrf ) on current density Jrf . Experimental and modeled results show that the patterning has no observable effect on the microwave residual RS or on the power dependence of RS .
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